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- Compact size.
- Low cost.
- 50 - 2500 nanometer resolution (XX).
- Zero index and ROI signal.
- Ultra high alignment tolerances.
- Non-contacting, operating in reflection.
- Impervious to atmospheric or laser wavelength changes.
- Impervious to off-axis translations.
MPE-F10-XX View Specifications View Drawing F10 User's Guide (pdf)
- 5 - 1000 nanometer resolution (XX).
- Non-contacting, operating in reflection.
- Impervious to atmospheric or laser wavelength changes.
- Impervious to off-axis translations.
- Very high alignment tolerances. No mechanical adjustments.
- Two layers of spatial filtering for contaminant rejection.
- Zero index available on MPE-CFZ.
- High accuracy scales available.
MPE-CF-XX, MPE-CFZ-XX View Specifications View Drawing CF User's Guide (pdf) Return to Products
